Industry Solutions
Semiconductor Fabrication
High-Vacuum Compatible Systems
Anorad is the undisputed leader in vacuum positioning applications. Our ultra-precision systems are designed from the bottom up to meet the vacuum compatible, sub-micron positioning requirements of semiconductor equipment manufacturers. Anorad products are routinely employed in many facets of the industry, including electron-beam lithography, scanning electron microscopy, and focused ion beam diagnostics.
Examples of Anorad's Vacuum Compatible Solutions
Focused Ion Beam Inspection
- Cost effective XY Θ 300mm positioning solutions using vacuum prepped standard stages
- Piezo ceramic linear motors offer zero-dither nanometer-level position stability
- Teflon jacketed cables, fluxless soldered connectors and low vapor pressure lubricant cleanly operate to 10-7 Torr
- Vented hardware, air cavities free, and non-porous electroless nickel finish enable rapid pump down
- Recirculating element bearings allow compact profile and small footprint
Scanning Electron Beam Lithography Stage
- Nonmagnetic XY positioning stage for nanometer lithography processes
- External linear servo motor drives with through-chamber pushrods provide high dynamic response with extremely low stray magnetic fields
- Thermally stable Zerodur® workpiece support plate with integral plane mirrors laser interferometer position feedback enables image placement accuracy of better than 0.05mm
- Suitable for writing reticles, optical phase shift masks, 1x X-ray masks and sub-micron direct write
Lithography Processes
- Proof of concept Scattering with Angular Limitation in Projection Electron beam Lithography (SCALPEL)
- System uses Anorad stages for mask and wafer motion
Scanning Electron Beam Inspection Stage

Open frame construction allows double-sided work piece access for inspection of wafers and X-ray masks
- Dual vacuum compatible brushless linear servo motor drive enables scanning speed position error of < 0.2µm
- High-precision stage construction with crossed roller bearings enables defect detection as small as 0.005µm
- Constructed using nonmagnetic and vacuum compatible materials for operation to 10-7 Torr
- Magnetic field variation at E-beam/wafer intersection of < 1 milligauss
Reticle Inspection / Defect Review
- XY vacuum compatible stage for 300 mm SEM defect review
- Piezoelectric locking system for nanometer-level stability
- Rigid aluminum construction minimizes Abbe error
- Glass scale encoders and interpolators for 1 nm resolution
PCLM Stages for High Vacuum
- Nonmagnetic piezo actuated 6-axis positioning stage
- Integral tip and tilt wafer leveling axes for ion beam lithography
- Carefully selected surface finishes, hardware and materials for rapid pump down times
Focused Ion Beam Lithography
- Precision XY vacuum compatible positioning system
- Nonmagnetic piezo ceramic linear motors minimize heat generation
- Electroless nickel plated finish
- Assembled in a cleanroom by gloved technicians and baked-out prior to shipment